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Design & Test, IEEE

Issue 1 • Date Feb. 2015

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Displaying Results 1 - 24 of 24
  • Front Cover

    Publication Year: 2015 , Page(s): C1
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  • [Front inside cover]

    Publication Year: 2015 , Page(s): C2
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  • [Masthead]

    Publication Year: 2015 , Page(s): 1
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  • Table of contents

    Publication Year: 2015 , Page(s): 2
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  • Departments

    Publication Year: 2015 , Page(s): 3
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  • Speeding Up Analog Integration and Test for Mixed-Signal SoCs [From the EIC]

    Publication Year: 2015 , Page(s): 4 - 5
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  • Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs

    Publication Year: 2015 , Page(s): 6 - 8
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  • Formal Interpretation of Assertion-Based Features on AMS Designs

    Publication Year: 2015 , Page(s): 9 - 17
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    The paper proposes the adoption of formal methods for modeling of analog functions. It explains how assertions can be overlaid onto the range of values of individual features in an analog function, and proceeds toward building a mathematical (hybrid automata) model to represent and analyze them. An LDO regulator and a battery charger are used as examples. View full abstract»

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  • A Procedure for Alternate Test Feature Design and Selection

    Publication Year: 2015 , Page(s): 18 - 25
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    This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit. View full abstract»

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  • A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods

    Publication Year: 2015 , Page(s): 26 - 35
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    This paper observes that a number of new methods have emerged for efficient and effective testing of data converters, but there is no work comparing their strengths and weaknesses. The authors describes recent methods in detail, highlighting important aspects and contrasting their abilities to perform various test measurements. View full abstract»

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  • Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation

    Publication Year: 2015 , Page(s): 36 - 43
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    This paper addresses the important problem of defect level estimation. For more than 30 years, there have been published models which are commonly used to estimate the time zero test escape rate of digital logic designs. However, estimating escape rate for analog circuits is much more challenging. This paper applies importance sampling techniques to this problem to arrive at a much more practical method of analog defect level computation. View full abstract»

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  • Digital Analog Design: Enabling Mixed-Signal System Validation

    Publication Year: 2015 , Page(s): 44 - 52
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    This paper proposes a method to validate mixed-signal circuits and systems using procedures similar to those used for digital model of the transistor implementation, the suitability of the design can be judged. The significance of this work is how these models are constructed and compared, and how this information is managed using existing digital CAD tools. Since analog test program content is typically compiled based on the specifications in the data sheet for the analog circuit, often without the benefit of fault coverage information, there are frequent redundancies in the overall test process. View full abstract»

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  • Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models

    Publication Year: 2015 , Page(s): 53 - 60
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    This paper presents statistical methods to identify and take advantage of correlations in the test methods and wafer-level spatial correlations among devices. The result, shown for industrial designs, is a far more optimized test suite. View full abstract»

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  • Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization

    Publication Year: 2015 , Page(s): 61 - 69
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    This paper proposes a fast and low-cost method of calibrating RF transceiver systems using on-chip DSP resources and some additional circuit control points. Experimental results on a commercial power amplifier demonstrate significant increases in production yields using the proposed approach. View full abstract»

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  • Call for Nominations

    Publication Year: 2015 , Page(s): 70
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  • CEDA Currents

    Publication Year: 2015 , Page(s): 71 - 72
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  • Open Access Publishing

    Publication Year: 2015 , Page(s): 73
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  • myIEEE

    Publication Year: 2015 , Page(s): 74
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  • Test Technology TC Newsletter

    Publication Year: 2015 , Page(s): 75 - 76
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  • IEEE Was Here [advertisement]

    Publication Year: 2015 , Page(s): 77
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  • IEEE Proceedings

    Publication Year: 2015 , Page(s): 78
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  • The Art of Certifying Analog/Mixed-Signal Circuits

    Publication Year: 2015 , Page(s): 79 - 80
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    This paper remarks on the increasing difficulty of analog verification in the face of technology scaling. The author proposes some ideas on how to alter our thinking to meet this challenge. View full abstract»

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  • [Back inside cover]

    Publication Year: 2015 , Page(s): C3
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  • [Back cover]

    Publication Year: 2015 , Page(s): C4
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Aims & Scope

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Andre Ivanov
Department of Electrical and Computer Engineering, UBC