IEEE Design & Test

Issue 5 • Oct. 2018

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  • Front Cover

    Publication Year: 2018, Page(s): C1
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  • Cover 2

    Publication Year: 2018, Page(s): C2
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  • IEEE Design&Test publication information

    Publication Year: 2018, Page(s): 1
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  • Table of Contents

    Publication Year: 2018, Page(s):2 - 3
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  • Self-Awareness in Systems on Chip, Part II

    Publication Year: 2018, Page(s): 4
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  • Guest Editorial: Special Issue on Self-Aware Systems on Chip

    Publication Year: 2018, Page(s):5 - 6
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  • Self-Test and Diagnosis for Self-Aware Systems

    Publication Year: 2018, Page(s):7 - 18
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (464 KB) | HTML iconHTML

    Self-testing hardware has a long tradition as a complement to manufacturing testing based on test stimuli and response analysis. Today, it is a mature field and many complex SoCs have self-testing structures built-in (BIST). For self-aware SoCs this is a key technology, allowing the system to distinguish between correct and erroneous behavior. This survey article reviews the state of the art and s... View full abstract»

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  • Self-Aware Network-on-Chip Control in Real-Time Systems

    Publication Year: 2018, Page(s):19 - 27
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (902 KB) | HTML iconHTML

    This article identifies the contradictory needs for dynamic adaptations and full predictability in complex, exacting applications like autonomous driving. While traditional methods facilitate either dynamic adaptation or fully predictable QoS, this article shows how these contradictory expectations can be reconciled in the control of a network-on-chip based on the system’s comprehensive understand... View full abstract»

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  • Self-Aware Thermal Management for High-Performance Computing Processors

    Publication Year: 2018, Page(s):28 - 35
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (570 KB) | HTML iconHTML

    Editor’s note:Thermal management in high-performance multicore platforms has become exceedingly complex due to variable workloads, thermal heterogeneity, and long, thermal transients. This article addresses these complexities by sophisticated analysis of noisy thermal sensor readings, dynamic learning to adapt to the peculiarities of the hardware and the applications, and a dynami... View full abstract»

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  • Run-Time Adaptive Power-Aware Reliability Management for Manycores

    Publication Year: 2018, Page(s):36 - 44
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1974 KB) | HTML iconHTML

    Due to increasing process, voltage, and temperature (PVT) variability, reliability is becoming a growing worry. This article addresses this concern with a combination of software and hardware hardening modes while considering power, performance, and overhead constraints. Similar to other examples in this special issue, this work illustrates that complex management tasks that have to integrate mult... View full abstract»

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  • An Empirical Set of Metrics for Embedded Systems Testing

    Publication Year: 2018, Page(s):45 - 53
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (615 KB) | HTML iconHTML

    Editor's note: Selecting the right platform for an embedded system is a challenging task, because there are no systematic methodologies for comprehensive evaluation and comparison of competing alternatives. This article partially addresses this problem by formulating a set of relevant metrics and an evaluation methodology. By applying their concepts to the evaluation of two alternative platforms, ... View full abstract»

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  • Enabling Automated Bug Detection for IP-Based Designs Using High-Level Synthesis

    Publication Year: 2018, Page(s):54 - 62
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (585 KB) | HTML iconHTML

    This article presents an automated approach for detecting system- level bugs in SoC designs that are composed of many IP blocks, without exposing sensitive information. The approach leverages high-level synthesis techniques. View full abstract»

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  • Advances in Forensic Data Acquisition

    Publication Year: 2018, Page(s):63 - 74
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (254 KB) | HTML iconHTML

    You all know this from watching CSI: When a crime is committed, usually some form of digital evidence is left on devices such as computers, mobile phones, or the navigation system of a car a suspect has used. Indeed, law enforcement agencies are regularly interested in data from personal devices to find evidence, guide investigations, or even act as proof in a court of law. This tutorial article b... View full abstract»

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  • The 55th Design Automation Conference

    Publication Year: 2018, Page(s):75 - 77
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  • TTTC Newsletter

    Publication Year: 2018, Page(s):78 - 79
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  • Self-Test and Self-Aware

    Publication Year: 2018, Page(s): 80
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (60 KB) | HTML iconHTML

    Self-Test and Diagnosis for Self-Aware Systems,” describes how such systems can use self-test to monitor their health. This led me to think about consciousness. View full abstract»

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  • Cover 3

    Publication Year: 2018, Page(s): C3
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  • Cover 4

    Publication Year: 2018, Page(s): C4
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Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

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Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)

Karlsruhe Institute of Technology (KIT)