IEEE Instrumentation & Measurement Magazine

Issue 4 • August 2018

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Displaying Results 1 - 18 of 18
  • IEEE Instrumentation & Measurement Magazine - Front cover

    Publication Year: 2018, Page(s): c1
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  • Table of contents

    Publication Year: 2018, Page(s): 1
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  • Welcome to IEEE AUTOTESTCON 2018 [President's Message]

    Publication Year: 2018, Page(s): 3
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  • Cyber security for automatic test equipment

    Publication Year: 2018, Page(s):4 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB) | HTML iconHTML

    The initial focus for the cyber security community has been to make operating systems and networks more secure and harder to penetrate. These improvements are making it more difficult to exploit these systems, driving attackers to turn their attention to embedded systems and hardware exploitation. It is expected that new threats from improperly secured embedded operating systems, poorly defended f... View full abstract»

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  • A new method to estimate expected number of failures for allocating spare parts and labor

    Publication Year: 2018, Page(s):9 - 21
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (249 KB) | HTML iconHTML

    In determining the optimal allocation of spare parts and labor in a machine shop, in addition to the planned inspections, the random failures must be considered. The expected number of failures must be therefore assessed. At present, literature on the subject mostly discusses minimal repairs and failure replacement, giving only a little attention to partial repairs. These models ignored the time p... View full abstract»

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  • A .NET fluent interface for signal-oriented test programming

    Publication Year: 2018, Page(s):13 - 19
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (172 KB) | HTML iconHTML

    This paper describes an innovative software interface design in support of signal-oriented test programming. The design makes use of modern Domain Specific Language (DSL) concepts and advanced C# language features to create an interface with excellent usability features and low implementation overhead. View full abstract»

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  • The past and future of electronics testing [Trends in Future I&M]

    Publication Year: 2018, Page(s):20 - 21
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (184 KB) | HTML iconHTML

    To have a meaningful discussion on the future trends in electronic testing, we should first try to understand the trends in the semiconductor industry over the past two decades. The early 1980s to late 1990s saw tremendous growth of the global semiconductor market, with an overall compound annual growth rate of 14.9%. During this time, the demand for integrated circuits kept growing, pushing the p... View full abstract»

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  • Automated configuration of modern ATE

    Publication Year: 2018, Page(s):22 - 26
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (172 KB) | HTML iconHTML

    Modern Automatic Test Equipment (ATE) must perform many tasks to support testing of devices. The devices being tested may be anything from simple circuit cards to complex multi-device systems. In addition, they may employ analog, digital and / or radio frequency testing. This, coupled with the desire to test the devices as quickly as possible, can drive ATE systems to employ multiple systems with ... View full abstract»

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  • Multiple fault diagnosis using factored evolutionary algorithms

    Publication Year: 2018, Page(s):27 - 38
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (608 KB) | HTML iconHTML

    When supporting commercial or defense systems such as aircraft avionics, guidance and control, electronic warfare, or propulsion systems, a perennial challenge is providing effective test and diagnosis strategies to minimize downtime, thereby maximizing system availability. One can argue that one of the most effective ways to maximize downtime is to be able to detect and isolate as many faults tha... View full abstract»

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  • The center of a souffle-metrology in the kitchen [Basic metrology]

    Publication Year: 2018, Page(s):39 - 40
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (136 KB) | HTML iconHTML

    In 1967, the Soviet Union's Venera-4 space mission to Venus sent back the first tantalizing temperature measurements of the Venusian atmosphere; Veneras -5 and -6 were launched in January 1969. A few months later, a famous lowtemperature physicist whimsically said, "I think it is a sad reflection on our civilization that while we can and do measure the temperature in the atmosphere of Venus we do ... View full abstract»

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  • Digital radio frequency memory synthetic instrument enhancing US navy automated test equipment mission

    Publication Year: 2018, Page(s):41 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1154 KB) | HTML iconHTML

    This research project aims to expand the capability of a current US Navy Automated Test Equipment (ATE) family of testers known as the Consolidated Automated Support System (CASS). Industry research is now focused on breaking the historical construct of test equipment. Advances in the field of Synthetic Instruments have opened the door to test avionics in new ways. Every year new capabilities are ... View full abstract»

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  • Interference measurements and failure analysis of patch-clamp laboratory instrumentation for electrophysiology tests

    Publication Year: 2018, Page(s):50 - 57
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1372 KB) | HTML iconHTML

    This work analyzes the patch-clamp technique, which is the gold standard for ion channel measurements in electrophysiology, as well as the required instrumentation and main interferences that may affect the measurement accuracy. Different sources of degradation are evaluated, such as failure in headstage cooling and pipette/electrode impedance compensation systems, electromagnetic interference (EM... View full abstract»

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  • 2016 Faculty course development award: Measurement architectures for electric systems

    Publication Year: 2018, Page(s):58 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (875 KB) | HTML iconHTML

    This work is an overview of what has been realized thanks to the grant awarded by the IEEE Instrumentation and Measurement Society, the 2016 Faculty Course Development Award. As a recipient of this award, I could deeply revise the content of the course I taught at Politecnico di Milano, buy new instruments for the didactic laboratory and show the students some new experiments. View full abstract»

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  • New products

    Publication Year: 2018, Page(s):64 - 68
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (601 KB) | HTML iconHTML

    Provides various new product announcements in the instrmentation and measurement industry. View full abstract»

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  • IMTC 2019 IEEE International Instrumentation & Measurement Technology Conference [Call for papers]

    Publication Year: 2018, Page(s): 69
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  • August calendar

    Publication Year: 2018, Page(s): 70
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  • 2019 IEEE Sensors Applications Symposium [Call for Papers]

    Publication Year: 2018, Page(s): 71
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  • Advertising index

    Publication Year: 2018, Page(s): 72
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Aims & Scope

IEEE Instrumentation & Measurement Magazine is a bimonthly publication.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org