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Shelf life of electronics/electrical devices

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2 Author(s)
Polanco, S. ; Commonwealth Edison Co., Downers Grove, IL, USA ; Behera, A.K.

The authors discuss inconsistencies which exist between various industry practices regarding the determination of shelf life for electrical and electronic components. New methodologies developed to evaluate the shelf life of electrical and electronic components are described, and numerous tests performed at Commonwealth Edison Company's Central Receiving Inspection and Testing (CRIT) Facility are presented. Based on testing and analysis using the Arrhenius methodology and typical materials used in the manufacturing of electrical and electronic components, the shelf life of these devices was determined to be indefinite. Various recommendations on achieving an indefinite shelf life are presented to ultimately reduce inventory and operating costs at nuclear power plants

Published in:

Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE

Date of Conference:

25-31 Oct 1992