Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers

A multi-probe non-destructive evaluation technique for quantifying the distribution of Curie temperature of large-size relaxor single crystal wafers is described. The results show that through selective dicing with the aid of the proposed non-destructive test, it is possible to produce large-area (say, 20/spl times/15 mm or larger) inclusion-free lead zinc niobate-lead titanate solid-solution (or PZN-PT) single crystal wafers with a narrow T/sub C/ distribution (i.e. /spl plusmn/1.5/spl deg/C), hence of consistent composition and properties, from [001] layer growth dominated flux-grown single crystals. Typical T/sub C/ variations between wafers are estimated at /spl plusmn/1.5/spl deg/C.