Improving the scan rate and image quality in tapping Mode Atomic Force Microscopy with piezoelectric shunt control

The scan rate of tapping mode Atomic Force Microscopy (AFM), when scanning in air, may be improved by reducing the quality (Q) factor of the micro-cantilever. Passive piezoelectric shunt control is implemented in the AFM by placing an electrical impedance in series with the cantilever tip oscillation circuit. This method is used to reduce the Q factor of a piezoelectric self actuating AFM micro-cantilever by a factor of 8. Experimental results demonstrate that scan rate and image quality may be improved significantly using this method.