A BIST methodology for iterative logic arrays

A methodology for pseudoexhaustive test of unilateral, one-dimensional iterative logic arrays (ILAs) in a built-in self-test environment is presented. Exhaustive patterns applied over a test frame permit application of exhaustive patterns to a cell and observation of its outputs. A test frame is composed of an initializing subframe. The pseudoexhaustive test design is performed by an algorithm that simply determines the length of the test frame. Algorithm results are given and a design-for-testability technique for ILAs is discussed.<
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