On-wafer radiation pattern measurements of integrated antennas on standard BiCMOS and glass processes for 40-80GHz applications

Integrated antenna on-wafer measurements, achieved on standard STMicroelectronics BiCMOS and glass processes, are presented for applications between 40 GHz and 80 GHz. Radiation pattern and S-parameter measurements of a dipole and a patch antenna are described. For the first time, measurements of integrated millimeterwave antennas are shown at these frequencies. A complete test bench has been realized. In addition, associated wideband high frequency dipole modeling is described.