Statistical Methods of Parametric Yield and Quality Enhancement

This chapter contains sections titled:

• Problems and Methodologies of Statistical Circuit Design

• Circuit Variables, Parameters, and Performances

• Statistical Modeling of Circuit (Simulator) Variables

• Acceptability Regions

• Parametric Yield

• Indirect Methods of Yield Enhancement

• Statistical Methods of Yield Optimization

• Design for Quality

• Conclusion

This chapter contains sections titled:

• References