SICS: a sensor interaction compensation scheme for microwave imaging

A new formulation is proposed to take into account the sensors used to measure the scattered field in microwave tomography setups. This formulation provides a way to fully compensate the perturbations resulting from the presence of an array of sensors around the target under test. A simple example is given to illustrate how this compensation can be implemented on an iterative Newton-Kantorovich reconstruction algorithm and to demonstrate its efficiency.