Multi-parameter high-resolution spatial maps of a CdZnTe radiation detector array

Resistivity results from a 48/spl times/48 pixelated CdZnTe (CZT) radiation detector array are presented alongside X-ray topography and detector mapping with a collimated gamma-ray beam. By using a variety of measurements performed on the same sample and registering each data set relative to the others, the spatial dependence of relationships between them was examined. The local correlations between resistivity and one measure of detector performance were strongly influenced by the positions of grain boundaries and other gross crystal defects in the sample. These measurements highlight the need for material studies of spatially heterogeneous CZT to record position information along with the parameters under study.