By Topic

MSIM: Multistage Illumination Modeling of Dermatological Photographs for Illumination-Corrected Skin Lesion Analysis

Sign In

Full text access may be available.

To access full text, please use your member or institutional sign in.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Glaister, J. ; Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada ; Amelard, R. ; Wong, A. ; Clausi, D.A.

Melanoma is the most deadly form of skin cancer and it is costly for dermatologists to screen every patient for melanoma. There is a need for a system to assess the risk of melanoma based on dermatological photographs of a skin lesion. However, the presence of illumination variation in the photographs can have a negative impact on lesion segmentation and classification performance. A novel multistage illumination modeling algorithm is proposed to correct the underlying illumination variation in skin lesion photographs. The first stage is to compute an initial estimate of the illumination map of the photograph using a Monte Carlo nonparametric modeling strategy. The second stage is to obtain a final estimate of the illumination map via a parametric modeling strategy, where the initial nonparametric estimate is used as a prior. Finally, the corrected photograph is obtained using the final illumination map estimate. The proposed algorithm shows better visual, segmentation, and classification results when compared to three other illumination correction algorithms, one of which is designed specifically for lesion analysis.

Published in:

Biomedical Engineering, IEEE Transactions on  (Volume:60 ,  Issue: 7 )