Measurement of independent piezoelectric constants of a Ca3TaGa3Si2O14 crystal by x-ray diffraction method

This work presents the results of independent piezoelectric constants measurements for calcium-tantalum gallosilicate (Ca
₃
TaGa
₃
Si
₂
O
₁₄
, CTGS) using double-crystal x-ray diffractometry. It is shown that one and the same sample can be used to measure all independent piezoconstants of the CTGS crystal. The measured values of the piezomoduli are d
₁₁
= - 3.7098 · 10
^-12
C N
^-1
and d
₁₄
= 24.29 · 10
^-12
C N
^-1
. Under the conditions of the experiment the measurement error was 3%.