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Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging

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7 Author(s)
Neubeck, S. ; School of Physics and Astronomy, University of Manchester, Manchester M13 9PL, United Kingdom ; You, Y.M. ; Ni, Z.H. ; Blake, P.
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In this letter, we show how high-resolution scanning tunneling microscopy (STM) imaging can be used to reveal that certain edges of micromechanically exfoliated single layer graphene crystals on silicon oxide follow either zigzag or armchair orientation. Using the cleavage technique, graphene flakes are obtained that very often show terminating edges seemingly following the crystallographic directions of the underlying honeycomb lattice. Performing atomic resolution STM-imaging on such flakes, we were able to directly prove this assumption. Raman imaging carried out on the same flakes further validated our findings.

Published in:

Applied Physics Letters  (Volume:97 ,  Issue: 5 )

Date of Publication:

Aug 2010

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