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Broadband characterization of low dielectric constant and low dielectric loss CYTUF cyanate ester printed circuit board material

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11 Author(s)
Deutsch, A. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Surovic, C.W. ; Lanzetta, A.P. ; Ainspan, H.A.
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Dielectric constant εr and broadband dielectric loss tan δ measurements were performed for the thermoplastic toughened cyanate ester printed circuit board CYTUF material. Characterization of tan δ over the 1-8 GHz frequency range was made using a simple short-pulse propagation technique. All the measurements were taken on four-metal-layer, 23×36 cm cards with representative transmission line structures. It was found the εr=3.48-3.64 and tan δ=0.0095-0.01, which are much lower than for standard FR-4 material. The impact of improved characteristics on wireability is analyzed through simulations of representative printed circuit board interconnections

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Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on  (Volume:19 ,  Issue: 2 )