A systematic treatment of conducting and dielectric bodies with arbitrarily thick or thin features using the method of moments

A systematic procedure for modeling electromagnetic scattering problems involving bodies with electrically thin features is discussed. The scattering bodies are represented using standard surface integral equation formulations and solutions are obtained via the method of moments (MOM). It is demonstrated that accurate evaluation of the moment matrix elements is critical for obtaining accurate solutions for scatterers having thin features. It is also shown (by numerical example) that some of the various surface integral formulations remain valid and can be used to obtain accurate scattering results for arbitrarily thin dielectric and conducting features. The use of the systematic approach for such problems is illustrated by incorporating the procedures into a two-dimensional (MOM) program. Sample results illustrating the technique's utility and validity are provided.<
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