Method for magnetic characterization of nanowire structures

A method for the magnetic characterization of nanowires systems is presented. It is based on first-order reversal curves (FORC) diagrams. The experimental difficulties and peculiarities of this approach when applied to nanowire systems are also described. Two samples containing approximately 20-/spl mu/m-long Ni wires, either 20 or 200 nm in diameter, were measured. The FORC diagrams for these two samples are presented and the results discussed.