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System identification using binary sensors

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3 Author(s)
Le Yi Wang ; Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA ; Ji-Feng Zhang ; Yin, G.G.

System identification is investigated for plants that are equipped with only binary-valued sensors. Optimal identification errors, time complexity, optimal input design, and impact of disturbances and unmodeled dynamics on identification accuracy and complexity are examined in both stochastic and deterministic information frameworks. It is revealed that binary sensors impose fundamental limitations on identification accuracy and time complexity, and carry distinct features beyond identification with regular sensors. Comparisons between the stochastic and deterministic frameworks indicate a complementary nature in their utility in binary-sensor identification.

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Automatic Control, IEEE Transactions on  (Volume:48 ,  Issue: 11 )