Firing Studies With a Model Thick Film Resistor System

A model resistor system consisting of RuO2 and a single glass was used to study the effects of heating rate, maximum temperature, and Iaolding time at maximum temperature on sheet resistance and temperature dependence of resistance. It was shown that proper selection of the firing parameters can yield good quality resistors having predetermined properties without the use ot' any chemical additives. The results were used to test theoretical models of charge transport, and it was shown that none of the available models can correlate the wide range of properties resulting from the varying firing conditions.