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Measuring the effective channel length of MOSFETs

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2 Author(s)
Ng, K.K. ; AT&T Bell Lab., Murray Hill, NJ, USA ; Brews, J.R.

Eleven measurement methods are outlined, and their assumptions are examined. The methods are analyzed, critiqued, and compared. Recommendations are made as to which methods are best under various conditions.<>

Published in:

Circuits and Devices Magazine, IEEE  (Volume:6 ,  Issue: 6 )