Technology roadmap on SOC testing: issues on SOC testing in DSM era

Summary form only given. Deep sub-micron technology is rapidly leading to exceedingly complex, billion- transistor chips. By these technology evolutions, a system is integrated into a chip so called a system-on-a-chip (SOC). In order to bridge the productivity gap between available transistors and the ability to be designed in SOC, higher-level behavioral language and design re-use become more common. However, these techniques affect test methodologies and failure analysis of SOC.