Modeling Layered Organic Samples of PSEUDO-SPECKLE Structures

We discuss numerical modeling and analyses performed in a multilayered periodic structure designed for nanoelectronics. The models facilitate evaluating thin films in terms of their electromagnetic parameters, and they thus assist experts in resolving various issues relevant to nanoelectronics, nanophotonics, resonance sensors, and related fields or components. As regards the actual concept of and motives behind this activity, modeling large-sized periodic structures utilizing organic materials enables us to examine the process and parameters of electromagnetic wave propagation in basic elements. The structures are inspected in view of their spectral properties and electromagnetic field distribution.