In situ reflectance- photoluminescence imaging on solution-processed perovskite thin-films

For the upscaling of hybrid perovskite photovoltaics, the understanding of the intermediate steps from solution to the polycrystalline film is pivotal. In situ characterization techniques can be a powerful tool to investigate the perovskite formation process and obtain direct feedback on its quality. Here, we propose in situ photoluminescence intensity, photoluminescence emission wavelength and reflectance imaging combined in one optical system with a high spatial and sub-second temporal resolution as an in situ real-time, monitoring technique. It is capable of surveilling the perovskite processing on areas larger 100 cm
²
and resolving even tiny differences in the processing parameters.