SEU evaluation of SRAM memories for space applications

SEU cross-sections were obtained for three different SRAM memories. The 1 Mbit White Electronics WMS128k8, the 256 kbit Austin MT5C2564 and the 256 kbit Austin MT5C2568 SRAMs were tested. The SEU thresholds, respectively were 1 MeV cm/sup 2//mg, 1.4 MeV cm/sup 2//mg, and 1.8 MeV cm/sup 2//mg. SEL thresholds were also obtained. These were 37 MeV cm/sup 2//mg, 37 MeV cm/sup 2//mg and 59 MeV cm/sup 2//mg, respectively.