Detection of Magnetic Circular Dichroism in Amorphous Materials Utilizing a Single-Crystalline Overlayer

As the technology of high-spatial resolution electron energy loss spectroscopy, an electron magnetic chiral dichroism (EMCD) method was regarded as a quantitative method of measuring spin and orbital magnetic moments, which is equivalent to x-ray magnetic circular dichroism (XMCD). Using the analytical method of EMCD in a transmission electron microscope allows the quantification of the magnetic structure of crystalline materials down to the nanometer scale
^[1]–[3]
. However, the restricting by the confined diffraction geometry applied in experiments
^[4]
, none experiments or theories have been performed to obtain the EMCD signals for amorphous materials yet, due to the lack of long range ordering.