Improving the Effectiveness of TMR Designs on FPGAs with SEU-Aware Incremental Placement

TMR combined with configuration scrubbing is an effective technique to mitigate against radiation-induced CRAM upsets on SRAM-based FPGAs. However, its effectiveness is limited by low-level common mode failures due to the physical mapping of a design to the FPGA device. This paper describes how common mode failures are introduced during the implementation process and introduces an approach for resolving them through a custom incremental placement tool for Xilinx 7-Series FPGAs. Multiple designs across multiple generations of devices are shown to be sensitive to common mode failures. Applying the incremental placement technique yields an improvement of 10,721x over an unmitigated design through fault-injection testing. Radiation testing is then performed to show that the of this technique is 91,500 days in GEO orbit, a 367x improvement over the unmitigated design and a 5x improvement over baseline TMR.