Multiphysics TAN Modeling of Uniaxial Vibration Loaded Pin–Socket Electrical Contact

This paper presents a multiphysics modeling of pin-socket under uniaxial vibration stress. The pin-socket behaves as a typically cylindrical dynamic contact structure as a function of the stress events. The pin-socket contact resistance fluctuation is expressed under the configuration of ideal, arbitrary roughness, and degraded surface contacts. To treat the problem, the pin slip is assumed to be in motion relatively to the socket. The multiphysics equivalent model is built with the tensorial analysis of networks (TAN) formalism. The novel model is implemented as a graph topology of coupled mechanical and electrical circuits. Based on the physical laws governing the structure, the tensorial metrics is expressed with the velocity and electrical currents as main unknowns via the Kron formalism. The multiphysics TAN model feasibility is validated with analytical calculations showing the contact resistance instantaneous variation versus the uniaxial sine waveform vibration load. The pin-socket vibration-position and vibration-velocity transmittances from 10 Hz to 1 kHz and time responses are discussed. The calculated time-dependent voltage drop across the pin-socket contact is compared with SPICE numerical simulations. The proposed modeling method presents a significant simplicity and fast computation time compared to the meshing computational methods as finite-element analysis.