Antenna measurements and applications in millimeter frequency range

Recently it has been rapidly increasing the uses and applications of millimeter and submillimeter electromagnetic (EM) materials, devices, and systems in the broad fields of natural and application sciences. Antenna characteristics and material properties are one of the key measurement quantities in EM metrology. Specular reflectance is a prerequisite to analysis of the channel characteristics for new millimeter and submillimeter indoor wireless communications. This paper briefly reviews an extrapolation range for testing general-purpose antennas such as standard gain horn antennas by using the three-antenna extrapolation technique, a quasi-optic freespace material measurement system for measuring the material properties of dielectric plates, and a specular reflectance measurement system for measuring the specular reflectance of dielectric plates and EM absorbers at KRISS in the frequency ranges from 110 GHz to 325 GHz.