Characterisation and performance of high power packaged devices

This paper presents a measurement system that combines the capabilities of a vector network analyser, load and source pull and time domain measurement in a single test-bench. The system is based upon the microwave transition analyser (MTA) and a high power test fixture which was designed in-house. The user may optimise the load and source impedance for best desired performance, output power, gain or efficiency. The results achieved using the nonlinear measurement system are detailed, along with the measurement system set up and large-signal calibration.