ISO26262-compliant soft-error mitigation in register banks

Temporary malfunction of ICs is often caused by Single Event Upsets (SEUs). That is why the automotive safety standard ISO 26262 demands measures to detect and mitigate a certain percentage of safety-critical SEUs. Different kinds of modules require different kinds of safety mechanisms. A frequently used module type is the Register Bank, which provides (quasi)static parameter settings to e.g. an analog block. A safety mechanism that detects and corrects SEU-caused failures in Register Banks is presented. Figures of Diagnostic Coverage and area overhead are shown for an automotive IC.