EM-CAD for complex electronics systems: A journey from order to chaos

In this paper, we present recent progress in the first-principles modeling and quantitative statistical analysis of complex electronics systems. The scientific contributions are twofold: (i) high-performance and scalable algorithms to conquer the computational complexity of extreme-scale simulations on massively parallel computing platforms; (ii) hybrid deterministic and stochastic formulations for the statistical characterization of the in-situ performance and system behavior. The work overcomes some key challenges in the in-situ verification of complex electronic systems in realistic circumstances, and significantly advance electromagnetic- and multiphysics-based computer-aided design (EM-CAD) for IC, electronics and microwave applications.