Architecture- and workload-dependent digital failure rate

The ability to determine product failure rate at the design conception stage would serve as a feedback to the design teams to create robust designs. IP hardening leading to a long lasting reliable product portfolio is the need of the hour for the upcoming IOT and Smart Driving Markets. Conventional aged static timing analysis does not take into account the aging due to the digital circuit workload at operational lifetime and a degradation modulation of 2–3X is observed. But, workload dependent digital circuit reliability analysis has been made possible with models that predict the aged standard cell behavior for its corresponding operational stress. This paper thus leverages the workload dependent reliability analysis for early product failure rate calculations.