Polarization phenomena in SrBi/sub 2/Ta/sub 2/O/sub 9/ ferroelectric thin films at the nanometer scale

Scanning force microscopy is applied to investigation of domain arrangement and nanoscale switching properties in SrBi/sub 2/Ta/sub 2/O/sub 9/ (SBT) thin films. Correlation between domain contrast and film texture is discussed. Statistical analysis of polarization reversal and local hysteresis loop measurements were performed. Polarization retention properties of SBT films were studied by direct observation of domain structure temporal behavior.