Odd-order probe correction technique for spherical near-field antenna measurements

In this paper, an odd-order probe for spherical near-field antenna measurements is defined. A probe correction technique for odd-order probes is then formulated and tested by computer simulations. The probe correction for odd-order probes is important, since a wide range of realistic antennas belongs to this class. To the authors' knowledge, the proposed technique is the first practical high-order probe correction technique that has been formulated in detail, has been tested, and has been shown to work.