Design and manufacture of hardware and software platform of universal measurement complex for research of deep level defects in semiconductors

Based on the analysis of studied physical processes, the amount of technical requirements to be met by measuring complex for research of the deep level defects in semiconductors have been formulated. Created complex is a flexible measuring system that can adapt to different measurement algorithms within Deep-Level Transient Spectroscopy (DLTS) and methods of obtaining of Capacitance-Voltage (CV) or Current-Voltage (IV) characteristics.