Cheap method for accurate characterization of orthomode transducers

The paper presents an original method for the precise charaterization of orthomode transducers with special focus to their isolation figures. This technique is based on 6 two-port measurements, 4 of which are already traditionally used to obtain approximate estimates of the scattering parameters. Unlike direct measurements or other techniques, the components required by the proposed procedure are commonly available in a standard RF laboratory thus allowing precise characterization of manufactured prototypes with cheap hardware.