Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC

Reliability of memory is crucial to overall reliability of SoCs. In our previous work, we enhanced reliability through an adaptive combination of repair and memory word correction, however, it is restricted to the identification of faulty memory words. In this work, we enhance reliability further by considering identification of not only faulty words, but aged words as well. We propose a novel method that adaptively assigns aged and faulty words to functional repair or correction based on their vulnerabilities.