Circulating power, RF magnetic field, and RF current density of shielded dielectric resonators for power handling analysis of high-temperature superconducting thin films of arbitrary thickness

In the current quest for HTS films with negligible power effects at high RF power levels for wireless communications, accurate calculations of a maximum RF magnetic field H/sub max/ and of a maximum RF current density J/sub max/ flowing on the surface of superconducting films is necessary to allow for any sensible conclusions and comparisons. As the dielectric resonator method is used most frequently for investigation of HTS losses, the authors discuss in this paper a dependence of the circulating power and of a maximum RF magnetic field H/sub max/ on dielectric resonators' geometry as well as of the maximum RF current density J/sub max/ flowing on the surface of superconducting films on the films' thickness, for a general case of a resonator shielded in a metallic cavity. The authors' results demonstrate that under the same input power levels the same HTS films may be exposed to differing RF power level conditions, depending on the cavity to dielectric radius ratio and thickness of superconducting films. This means that there may be a significant discrepancy between calculated and real power handling capabilities of HTS films tested in different dielectric resonators unless correct formulas are used.