Simulation of Proton Induced SET in Linear Devices and Assessment of Sensitive Thicknesses

This study aims to accurately determine analog SET proton cross sections derived from heavy ion data using gateway tools such as METIS, SIMPA or the more recent METIS approach we developed within Airbus Group. We validate the methodology on three linear devices and show promising results. Especially, METIS could be used in a reversed manner to determine the sensitive thickness based on the knowledge of both proton and heavy ion cross sections.