1.1 Ghz integer N phase lock loop with superior single event upset and total dose properties suitable for commercial space applications

Poor single event upset (SEU) and single event latchup (SEL) immunity are of major concern in high speed RF phase lock loops (PLLs) incorporated in many of current commercial satellites. As a result, greater demands are placed at the system level to compensate for this. These include reloading programming every clock cycle, parallel interfaces and redundancy, which result in increased size, weight, complexity and power. We present in this paper a 1.1 Ghz integer N PLL which is inherently SEL immune, has SEU rates less than 10/sup -9/ errors/bit-day (orders of magnitude better than currently available), excellent phase noise performance and standby current up to 100 krads(Si) total dose. This part is currently being manufactured on Peregrine Semiconductor's 0.8 /spl mu/m ultra thin silicon on sapphire UTSi/sup R/ process.