Testing ultra-precise, strategic-grade instrumentation using a flexible and modular common test station architecture

As strategic-grade instrumentation becomes increasingly more complex and accurate, developing robust, flexible, and cost-effective test platforms is paramount. Custom Automated Test Equipment (ATE) solutions designed to detect assembly defects and verify conformance to stringent design goals are developed for production acceptance. However, this custom “point-solution” approach is labor intensive; costly to design, manufacture, and maintain; and application-specific. The Universal Test Station (UTS) approach leverages commercial-off-the-shelf (COTS), industry-standard equipment to develop a modular hardware platform with a software-driven design that provides robustness, flexibility, and significant life-cycle cost savings.