An analytical model for spectral peak frequency prediction of substrate noise in CMOS substrates

This paper proposes an analytical model describing the generation of switching current noise in CMOS substrates. The model eliminates the need for SPICE simulations in existing methods by conducting a transient analysis on a generic CMOS inverter and approximating the switching current waveform using a Modified Raised Cosine (MORAC) equation. The proposed model is scalable, easy to implement and capable of predicting the spectral peak frequency of the substrate noise. The validation has been done via simulations and measurements. Good agreement has been found between the modeled and the measured results.