An Analysis of Industrial SRAM Test Results—A Comprehensive Study on Effectiveness and Classification of March Test Algorithms

This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient ones are identified.