A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

A method is proposed to characterize the nonideal behavior of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behavior of the data acquisition channel (amplifiers, sample-and-hold, analog-digital convertor); the time base distortion; and the time jitter. These errors are quantified starting from a series of repeated sinewave measurements.