An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line method

The uncertainties of conductivity σ and dielectric constant є of the short-circuited tine (SCL) method due to the measured errors in the VSWR and the position of standing-wave minimum are studied. In order to cover most of the fast ion conductors, the range of σ from 10
⁻⁴
to 1.0 (Ω cm) is considered. The results of the s nah si s provide the order of accuracy one can achieve in these measurements. The effect of sample thickness, high conductivity, and negative dielectric constant upon uncertainity are examined. Measurements on a chloroben-zene sample are used to simulate this analysis. A relationship between σ, є, and operating frequency is derived which allows us to determine the limit of application of the SCL method.