An on-chip IDDT current sensor based on current-to-voltage conversion

In this paper, the dynamic supply current test (I
_DDT
) for logic circuits is presented, where the targeted defects are weak opens in regular structures (SRAM arrays). Considerations about the current based tests are made, and a method of IDDT sensor realization is presented. The method is based on conversion of the current waveform to a voltage waveform. Also the most effective parameters of both the dynamic supply current waveform and voltage waveform are analyzed and evaluated.