Evaluating the use of a platform for combined tests of total ionizing dose radiation and Electromagnetic immunity

Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.