Principles and application of advanced transient photoconductivity techniques

Rapid advances in instrumentation and measurement technology are partly due to our better understanding of properties of materials and devices used in this technology. Important electrical properties of a wide range of high resistivity materials and devices can be investigated using techniques based on transient photoconductivity. In this paper, the principles of operation of advanced transient photoconductivity techniques developed in recent years and their application to amorphous semiconductors and polymeric materials are discussed. A novel apparatus developed by the authors are briefly described.