Characterization of electrical transverse conductivity of space dielectric materials

The effect of ionizing radiation processes and electron penetration depth on the dielectric properties of a 127μm Teflon FEP sample was investigated by surface potential measurements. We have been able to reveal the presence of a transverse conductivity that is enhanced by radiation ionisation process. The irradiation tests performed as a function of the irradiation energy revealed a strong influence of the electron penetration depth on the intrinsic transverse conductivity: this feature might be assigned to the evolution of traps density with the penetration depth.