Analysis of Main Degradation in Lasers With p-/n-Type InP Buried Layers Using OBIC Technique

The main degradation of the t
^0.5
deterioration property (second-stage degradation) in lasers during constant-power aging is investigated by using the optical beam-induced current technique. We clarify that defects that cause this second-stage degradation diffuse mainly from around the regrown interface of the p-type InP cladding layer above the active layer to the active layer via the separate confinement heterostructure layer.