AFM study of atomic-flat terraces on ZnWO4 (010) cleaved surface

Atomic force microscopy (AFM) is a useful instrument to explore the top-surface properties. The nano-morphology of ZnWO
₄
(010) cleaved surface has been evaluated in the present study. Optical-quality ZnWO
₄
crystal has been grown by the Low Thermal Gradient Czochralski technique. An atomically smooth surface can be obtained by mechanical cleaving under ambient atmospheric conditions due to high cleavage of ZnWO
₄
crystal parallel the (010). Atomic steps with height of 0.57 nm were observed by AFM measurements. The steps contain mesodefect peaks with height of ~1 nm located uniformly on the cleaved surface.